Laurila, T., Vuorinen, V., Paulasto-Kröckel, M., Turunen, M., Mattila, T. T., & Kivilahti, J. (2012). Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. Springer London.
Chicago Style (17th ed.) CitationLaurila, Tomi, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, and Jorma Kivilahti. Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. London: Springer London, 2012.
MLA (8th ed.) CitationLaurila, Tomi, et al. Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. Springer London, 2012.
Warning: These citations may not always be 100% accurate.
