Παραπομπή σε μορφή APA (7η εκδ.)

Laurila, T., Vuorinen, V., Paulasto-Kröckel, M., Turunen, M., Mattila, T. T., & Kivilahti, J. (2012). Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. Springer London.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Laurila, Tomi, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, και Jorma Kivilahti. Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. London: Springer London, 2012.

Παραπομπή σε μορφή MLA (8th εκδ.)

Laurila, Tomi, et al. Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach. Springer London, 2012.