MEMS and Nanotechnology, Volume 4 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics /

MEMS and Nanotechnology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.  The full set of proceedings also includes volu...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Proulx, Tom (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2011.
Σειρά:Conference Proceedings of the Society for Experimental Mechanics Series,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Integrated Process Feasibility of Hard-mask for Tight Pitch Interconnects Fabrication
  • Thermoelectric Effects in Current Induced Crystallization of Silicon Microstructures
  • Evaluation of Resistance Measurement Techniques in Carbon Black and Carbon
  • Nano-tubes Reinforced Epoxy
  • A Nano-tensile Tester for Creep Studies
  • The Measurement of Cyclic Creep Behavior in Copper Thin Film Using Microtensile Testing
  • New Insight Into Pile-Up in Thin Film Indentation
  • Measuring Substrate-independent Young’s Modulus of Thin Films
  • Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach
  • Nano-indentation Studies of Polyglactin 910 Monofilament Sutures
  • Analytical Approach for the Determination of Nanomechanical Properties for Metals
  • Advances in Thin Film Indentation
  • Cyclic Nanoindentation Shakedown of Muscovite and its Elastic Modulus Measurement
  • Assessment of Digital Holography for 3D-shape Measurement of Micro Deep Drawing Parts in Comparison to Confocal Microscopy
  • Full-field Bulge Testing Using Global Digital Image Correlation
  • Experimental Investigation of Deformation Mechanisms Present in Ultrafine-grained Metals
  • Characterization of  a Variation on AFIT's Tunable MEMS Cantilever Array Metamaterial
  • MEMS for Real-time Infrared Imaging
  • New Insights Into Enhancing Microcantilever MEMS Sensors
  • A Miniature MRI-compatible Fiber-optic Force Sensor Utilizing Fabry-Perot Interferometer
  • Micromechanical Structure With Stable Linear Positive and Negative Stiffness
  • Terahertz Metamaterial Structures Fabricated by PolyMUMPs
  • Investigations Into 1D and 2D Metamaterials at Infrared Wavelengths
  • MEMS Integrated Metamaterials With Variable Resonance Operating at RF Frequencies
  • Creep Measurements in Free-standing Thin Metal Film Micro-cantilever Bending
  • MEMS Reliability for Space Applications by Elimination of Potential Failure Modes Through Analysis
  • Analysis and Evaluation Methods Associated With the Application of Compliant Thermal Interface Materials in Multi-chip Electronic Board Assemblies
  • Hierarchical Reliability Model for Life Prediction of Actively Cooled LED-based Luminaire
  • Direct Determination of Interfacial Traction-separation Relations in Chip-package Systems.