Predictive Technology Model for Robust Nanoelectronic Design

• Κύριος συγγραφέας: Cao, Yu (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2011.
• Σειρά: Integrated Circuits and Systems,
• Θέματα: Engineering.; Computer software > Reusability.; Electronics.; Microelectronics.; Electronic circuits.; Nanotechnology.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Performance and Reliability.
• Φυσική περιγραφή: XV, 173 p. online resource.
• ISBN: 9781461404453
• ISSN: 1558-9412

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.