Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design o...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Shen, Ruijing (Συγγραφέας), Tan, Sheldon X.-D (Συγγραφέας), Yu, Hao (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US, 2012.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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020 |a 9781461407881  |9 978-1-4614-0788-1 
024 7 |a 10.1007/978-1-4614-0788-1  |2 doi 
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100 1 |a Shen, Ruijing.  |e author. 
245 1 0 |a Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs  |h [electronic resource] /  |c by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu. 
264 1 |a Boston, MA :  |b Springer US,  |c 2012. 
300 |a XXX, 306 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
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347 |a text file  |b PDF  |2 rda 
505 0 |a Fundamentals of Statistical Analysis -- Statistical Full-Chip Leakage Power Analysis -- Statistical Full-Chip Dynamic Power Analysis -- Statistical Parasitic Extraction -- Statistical Compact Modeling and Reduction of Interconnects -- Statistical Analysis of Global Interconnects -- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits. 
520 |a Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.  Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.  Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. . 
650 0 |a Engineering. 
650 0 |a Computer-aided engineering. 
650 0 |a Nanotechnology. 
650 0 |a Electronic circuits. 
650 1 4 |a Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Computer-Aided Engineering (CAD, CAE) and Design. 
650 2 4 |a Nanotechnology and Microengineering. 
700 1 |a Tan, Sheldon X.-D.  |e author. 
700 1 |a Yu, Hao.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9781461407874 
856 4 0 |u http://dx.doi.org/10.1007/978-1-4614-0788-1  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)