Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

• Κύριοι συγγραφείς: Shen, Ruijing (Συγγραφέας), Tan, Sheldon X.-D (Συγγραφέας), Yu, Hao (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2012.
• Θέματα: Engineering.; Computer-aided engineering.; Nanotechnology.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.; Nanotechnology and Microengineering.

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design o...