Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

• Main Authors: Shen, Ruijing (Author), Tan, Sheldon X.-D (Author), Yu, Hao (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2012.
• Subjects: Engineering.; Computer-aided engineering.; Nanotechnology.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.; Nanotechnology and Microengineering.

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design o...