Abu-Rahma, M. H., & Anis, M. (2013). Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield. Springer New York : Imprint: Springer.
Chicago Style (17th ed.) CitationAbu-Rahma, Mohamed H., and Mohab Anis. Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield. New York, NY: Springer New York : Imprint: Springer, 2013.
MLA (8th ed.) CitationAbu-Rahma, Mohamed H., and Mohab Anis. Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield. Springer New York : Imprint: Springer, 2013.
Warning: These citations may not always be 100% accurate.
