Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield /

Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield /

Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost,...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Abu-Rahma, Mohamed H. (Συγγραφέας), Anis, Mohab (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	New York, NY : Springer New York : Imprint: Springer, 2013.
Θέματα:	Engineering. Computer-aided engineering. Electronic circuits. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

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