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03205nam a22004815i 4500 |
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978-1-4614-2296-9 |
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120307s2012 xxu| s |||| 0|eng d |
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|a 9781461422969
|9 978-1-4614-2296-9
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|a 10.1007/978-1-4614-2296-9
|2 doi
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|a 621.3815
|2 23
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|a Onabajo, Marvin.
|e author.
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|a Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
|h [electronic resource] /
|c by Marvin Onabajo, Jose Silva-Martinez.
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|a Boston, MA :
|b Springer US,
|c 2012.
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|a XVIII, 174 p.
|b online resource.
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|a text
|b txt
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|a computer
|b c
|2 rdamedia
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|a online resource
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|a text file
|b PDF
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|a Introduction -- Process Variation Challenges and Solutions Approaches -- High-Linearity Transconductance Amplifiers with Digital Correction Capability -- Multi-Bit Quantizer Design for Continuous-Time Sigma-Delta Modulators with Reduced Device Matching Requirements -- An On-Chip Temperature Sensor for the Measurement of RF Power Dissipation and Thermal Gradients -- Mismatch Reduction for Transitiors in High-Frequency Differential Analog Signal Paths -- Summary and Conclusions.
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|a This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
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|a Engineering.
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|a Microprocessors.
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|a Electronics.
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|a Microelectronics.
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|a Electronic circuits.
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|a Engineering.
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|a Circuits and Systems.
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|a Electronics and Microelectronics, Instrumentation.
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|a Processor Architectures.
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|a Silva-Martinez, Jose.
|e author.
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9781461422952
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|u http://dx.doi.org/10.1007/978-1-4614-2296-9
|z Full Text via HEAL-Link
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|a ZDB-2-ENG
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|a Engineering (Springer-11647)
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