Atom Probe Microscopy

• Κύριοι συγγραφείς: Gault, Baptiste (Συγγραφέας), Moody, Michael P. (Συγγραφέας), Cairney, Julie M. (Συγγραφέας), Ringer, Simon P. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2012.
• Σειρά: Springer Series in Materials Science, 160
• Θέματα: Materials science.; Nanochemistry.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Nanoscale Science and Technology.; Spectroscopy and Microscopy.

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...

Πίνακας περιεχομένων:

• Preface
• Acknowledgements
• List of Acronyms and Abbreviations
• List of Terms
• List of Non-SI Units and Constant Values
• PART I Fundamentals
• 1. Introduction
• 2. Field Ion Microscopy
• 3 From Field Desorption Microscopy to Atom Probe Tomography
• Part II Practical aspects
• 4. Specimen Preparation
• 5. Experimental protocols in Field Ion Microscopy
• 6. Experimental protocols
• 7. Tomographic reconstruction
• PART III Applying atom probe techniques for materials science
• 8. Analysis techniques for atom probe tomography
• 9. Atom probe microscopy and materials science
• Appendices.