Circuit Design for Reliability

• Corporate Author: SpringerLink (Online service)
• Other Authors: Reis, Ricardo (Editor), Cao, Yu (Editor), Wirth, Gilson (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York : Imprint: Springer, 2015.
• Subjects: Engineering.; Computer-aided engineering.; Quality control.; Reliability.; Industrial safety.; Electronic circuits.; Circuits and Systems.; Quality Control, Reliability, Safety and Risk.; Computer-Aided Engineering (CAD, CAE) and Design.

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ran...

Table of Contents:

• Introduction
• Recent Trends in Bias Temperature Instability
• Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability
• Atomistic Simulations on Reliability
• On-chip characterization of statistical device degradation
• Circuit Resilience Roadmap
• Layout Aware Electromigration Analysis of Power/Ground Networks
• Power-Gating for Leakage Control and Beyond
• Soft Error Rate and Fault Tolerance Techniques for FPGAs.