Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Ueda, Osamu (Επιμελητής έκδοσης), Pearton, Stephen J. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2013.
• Θέματα: Physics.; Electronic circuits.; Lasers.; Photonics.; Optics.; Optoelectronics.; Plasmons (Physics).; Electronics.; Microelectronics.; Optical materials.; Electronic materials.; Materials science.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Optical and Electronic Materials.; Electronics and Microelectronics, Instrumentation.; Electronic Circuits and Devices.; Characterization and Evaluation of Materials.; Laser Technology, Photonics.

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and...

Πίνακας περιεχομένων:

• Preface
• Part 1. Materials Issues and Reliability of Optical Devices
• 1. Reliability Testing of Semiconductor Optical Devices
• 2. Failure Analysis of Semiconductor Optical Devices
• 3. Failure Analysis using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
• 4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
• 5. Catastrophic Optical-damage in High Power, Broad-Area Laser-diodes
• 6. Reliability and Degradation of Vertical Cavity Surface Emitting Lasers
• 7. Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes
• 8. InGaN Laser Diode Degradation
• 9. Radiation-enhanced Dislocation Glide - The Current Status of Research
• 10. Mechanism of Defect Reactions in Semiconductors
• Part 2. Materials Issues and Reliability of Electron Devices
• 11. Reliability Studies in the Real World
• 12. Strain Effects in AlGaN/GaN HEMTs
• 13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
• 14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
• 15. Novel Dielectrics for GaN Device Passivation And Improved Reliability
• 16. Reliability Simulation
• 17. The Analysis of Wide Bandgap Semiconductors Using Raman Spectroscopy
• 18. Reliability Study of InP-Based HBTs Operating at High Current Density
• Index.