Maricau, E., & Gielen, G. (2013). Analog IC Reliability in Nanometer CMOS. Springer New York : Imprint: Springer.
Chicago Style (17th ed.) CitationMaricau, Elie, and Georges Gielen. Analog IC Reliability in Nanometer CMOS. New York, NY: Springer New York : Imprint: Springer, 2013.
MLA (8th ed.) CitationMaricau, Elie, and Georges Gielen. Analog IC Reliability in Nanometer CMOS. Springer New York : Imprint: Springer, 2013.
Warning: These citations may not always be 100% accurate.