Bias Temperature Instability for Devices and Circuits

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Grasser, Tibor (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2014.
• Θέματα: Engineering.; Semiconductors.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Quality Control, Reliability, Safety and Risk.

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability.  Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, ano...

Πίνακας περιεχομένων:

• Introduction
• Characterization, Experimental Challenges
• Advanced Characterization
• Characterization of Nanoscale Devices
• Statistical Properties/Variability
• Theoretical Understanding
• Possible Defects: Experimental
• Possible Defects: First Principles
• Modeling
• Technological Impact
• Silicon dioxides/SiON
• High-k oxides
• Alternative technologies
• Circuits.