APA (7th ed.) Citation

Joy, D. C. (2013). Helium Ion Microscopy: Principles and Applications. Springer New York : Imprint: Springer.

Chicago Style (17th ed.) Citation

Joy, David C. Helium Ion Microscopy: Principles and Applications. New York, NY: Springer New York : Imprint: Springer, 2013.

MLA (8th ed.) Citation

Joy, David C. Helium Ion Microscopy: Principles and Applications. Springer New York : Imprint: Springer, 2013.