Practical Materials Characterization
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
Corporate Author: | SpringerLink (Online service) |
---|---|
Other Authors: | Sardela, Mauro (Editor) |
Format: | Electronic eBook |
Language: | English |
Published: |
New York, NY :
Springer New York : Imprint: Springer,
2014.
|
Subjects: | |
Online Access: | Full Text via HEAL-Link |
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