Practical Materials Characterization
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
Συγγραφή απο Οργανισμό/Αρχή: | |
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Άλλοι συγγραφείς: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York, NY :
Springer New York : Imprint: Springer,
2014.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- 1. X-Ray Diffraction and Reflectivity
- 2. Introduction to Optical Characterization of Materials
- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)
- 4. Secondary Ion Mass Spectrometry
- 5. Transmission Electron Microscopy.