Practical Materials Characterization

• Corporate Author: SpringerLink (Online service)
• Other Authors: Sardela, Mauro (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York : Imprint: Springer, 2014.
• Subjects: Materials science.; Mass spectrometry.; Spectroscopy.; Microscopy.; Materials Science.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Mass Spectrometry.

This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...

Table of Contents:

• 1. X-Ray Diffraction and Reflectivity
• 2. Introduction to Optical Characterization of Materials
• 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)
• 4. Secondary Ion Mass Spectrometry
• 5. Transmission Electron Microscopy.