CMOS Test and Evaluation A Physical Perspective /
This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...
Κύριοι συγγραφείς: | Bhushan, Manjul (Συγγραφέας), Ketchen, Mark B. (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York, NY :
Springer New York : Imprint: Springer,
2015.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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