CMOS Test and Evaluation A Physical Perspective /

• Main Authors: Bhushan, Manjul (Author), Ketchen, Mark B. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York : Imprint: Springer, 2015.
• Subjects: Engineering.; Semiconductors.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Electronic circuits.; Electronics and Microelectronics, Instrumentation.; Circuits and Systems.; Quality Control, Reliability, Safety and Risk.

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

Table of Contents:

• Introduction
• CMOS Circuit Basics
• CMOS Storage Elements and Synchronous Logic
• IDDQ and Power
• Embedded PVT Monitors
• Variability
• Product Chip Test and Characterization
• Reliability, Burn-In and Guardbands
• Data Analysis and Characterization
• CMOS Metrics and Model Evaluation.