CMOS Test and Evaluation A Physical Perspective /

• Κύριοι συγγραφείς: Bhushan, Manjul (Συγγραφέας), Ketchen, Mark B. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2015.
• Θέματα: Engineering.; Semiconductors.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Electronic circuits.; Electronics and Microelectronics, Instrumentation.; Circuits and Systems.; Quality Control, Reliability, Safety and Risk.

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

Πίνακας περιεχομένων:

• Introduction
• CMOS Circuit Basics
• CMOS Storage Elements and Synchronous Logic
• IDDQ and Power
• Embedded PVT Monitors
• Variability
• Product Chip Test and Characterization
• Reliability, Burn-In and Guardbands
• Data Analysis and Characterization
• CMOS Metrics and Model Evaluation.