Παραπομπή σε μορφή APA (7η εκδ.)

Zuo, J. M., & Spence, J. C. (2017). Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. Springer New York : Imprint: Springer.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Zuo, Jian Min, και John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. New York, NY: Springer New York : Imprint: Springer, 2017.

Παραπομπή σε μορφή MLA (8th εκδ.)

Zuo, Jian Min, και John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. Springer New York : Imprint: Springer, 2017.