APA (7th ed.) Citation

Zuo, J. M., & Spence, J. C. (2017). Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. Springer New York : Imprint: Springer.

Chicago Style (17th ed.) Citation

Zuo, Jian Min, and John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. New York, NY: Springer New York : Imprint: Springer, 2017.

MLA (8th ed.) Citation

Zuo, Jian Min, and John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. Springer New York : Imprint: Springer, 2017.