Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience /

• Κύριοι συγγραφείς: Zuo, Jian Min (Συγγραφέας), Spence, John C.H (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2017.
• Θέματα: Materials science.; Nanochemistry.; Solid state physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Optics, Lasers, Photonics, Optical Devices.; Nanoscale Science and Technology.; Solid State Physics.

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...