Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering /

This book covers reliability assessment and prediction of new technologies such as next generation networks that use cloud computing, Network Function Virtualization (NVF), Software Defined Network (SDN), Next Generation Transport, Evolving Wireless Systems, Digital VoIP Telephony, and Reliability T...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Ali, Syed Riffat (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
Έκδοση:1st ed. 2019.
Σειρά:Signals and Communication Technology,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:This book covers reliability assessment and prediction of new technologies such as next generation networks that use cloud computing, Network Function Virtualization (NVF), Software Defined Network (SDN), Next Generation Transport, Evolving Wireless Systems, Digital VoIP Telephony, and Reliability Testing techniques specific to Next Generation Networks (NGN). This book introduces the technology to the reader first, followed by advanced reliability techniques applicable to both hardware and software reliability analysis. The book covers methodologies that can predict reliability using component failure rates to system level downtimes. The book's goal is to familiarize the reader with analytical techniques, tools and methods necessary for analyzing very complex networks using very different technologies. The book lets readers quickly learn technologies behind currently evolving NGN and apply advanced Markov modeling and Software Reliability Engineering (SRE) techniques for assessing their operational reliability. Covers reliability analysis of advanced networks and provides basic mathematical tools and analysis techniques and methodology for reliability and quality assessment; Develops Markov and Software Engineering Models to predict reliability; Covers both hardware and software reliability for next generation technologies.
Φυσική περιγραφή:XXVI, 311 p. 182 illus., 168 illus. in color. online resource.
ISBN:9783030016470
ISSN:1860-4862
DOI:10.1007/978-3-030-01647-0