SpringerLink (Online service), Zhang, Z., Suter, D., Tian, Y., Branzan Albu, A., Sidère, N., & Jair Escalante, H. (2019). Pattern Recognition and Information Forensics: ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, Revised Selected Papers (1st ed. 2019.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-030-05792-3
Παραπομπή σε μορφή Chicago (17η εκδ.)SpringerLink (Online service), Zhaoxiang Zhang, David Suter, Yingli Tian, Alexandra Branzan Albu, Nicolas Sidère, και Hugo Jair Escalante. Pattern Recognition and Information Forensics: ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, Revised Selected Papers. 1st ed. 2019. Cham: Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-05792-3.
Παραπομπή σε μορφή MLA (8th εκδ.)SpringerLink (Online service), et al. Pattern Recognition and Information Forensics: ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, Revised Selected Papers. 1st ed. 2019. Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-05792-3.
