Atomic Force Microscopy
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...
Κύριος συγγραφέας: | |
---|---|
Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Cham :
Springer International Publishing : Imprint: Springer,
2019.
|
Έκδοση: | 2nd ed. 2019. |
Σειρά: | NanoScience and Technology,
|
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Introduction
- Part I: Scanning Probe Microscopy Instrumentation
- Harmonic Oscillator
- Technical Aspects of Scanning Probe Microscopy
- Scanning Probe Microscopy Designs
- Electronics for Scanning Probe Microscopy
- Lock-In Technique
- Data Representation and Image Processing
- Artifacts in SPM
- Work Function, Contact Potential, and Kelvin Probe
- Part II: Atomic Force Microscopy (AFM)
- Forces between Tip and Sample
- Technical Aspects of Atomic Force Microscopy
- Static Atomic Force Microscopy
- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
- Intermittent Contact Mode/Tapping Mode
- Mapping of Mechanical Properties Using Force-Distance
- Frequency Modulation (FM) Mode in Dynamic Atomic Force
- Noise in Atomic Force Microscopy
- Quartz Sensors in Atomic Force Microscopy.