Atomic Force Microscopy

• Κύριος συγγραφέας: Voigtländer, Bert (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Έκδοση: 2nd ed. 2019.
• Σειρά: NanoScience and Technology,
• Θέματα: Spectroscopy.; Microscopy.; Nanotechnology.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.; Nanoscale Science and Technology.; Biological Microscopy.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

Πίνακας περιεχομένων:

• Introduction
• Part I: Scanning Probe Microscopy Instrumentation
• Harmonic Oscillator
• Technical Aspects of Scanning Probe Microscopy
• Scanning Probe Microscopy Designs
• Electronics for Scanning Probe Microscopy
• Lock-In Technique
• Data Representation and Image Processing
• Artifacts in SPM
• Work Function, Contact Potential, and Kelvin Probe
• Part II: Atomic Force Microscopy (AFM)
• Forces between Tip and Sample
• Technical Aspects of Atomic Force Microscopy
• Static Atomic Force Microscopy
• Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
• Intermittent Contact Mode/Tapping Mode
• Mapping of Mechanical Properties Using Force-Distance
• Frequency Modulation (FM) Mode in Dynamic Atomic Force
• Noise in Atomic Force Microscopy
• Quartz Sensors in Atomic Force Microscopy.