Introduction to Quantum Metrology The Revised SI System and Quantum Standards /

• Κύριος συγγραφέας: Nawrocki, Waldemar (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Έκδοση: 2nd ed. 2019.
• Θέματα: Physical measurements.; Measurement .; Electronics.; Microelectronics.; Nanoscale science.; Nanoscience.; Nanostructures.; Nanotechnology.; Measurement Science and Instrumentation.; Electronics and Microelectronics, Instrumentation.; Nanoscale Science and Technology.; Nanotechnology and Microengineering.

This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass,...