Introduction to Quantum Metrology The Revised SI System and Quantum Standards /

• Main Author: Nawrocki, Waldemar (Author, http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Edition: 2nd ed. 2019.
• Subjects: Physical measurements.; Measurement .; Electronics.; Microelectronics.; Nanoscale science.; Nanoscience.; Nanostructures.; Nanotechnology.; Measurement Science and Instrumentation.; Electronics and Microelectronics, Instrumentation.; Nanoscale Science and Technology.; Nanotechnology and Microengineering.

This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass,...

Table of Contents:

• Preface
• Theoretical Background of Quantum Metrology
• Measurements, Standards and Systems of Units
• The Revised SI System of Units
• Quantum Voltage Standards
• SQUID Detectors of Magnetic Flux
• Quantum Hall Effect and the Resistance Standard
• Quantization of Electrical Conductance and Thermal Conductance in Nanostructures
• Single Electron Tunneling
• Atomic Clocks and Time Scales
• Standards and Measurements of Length
• Satellite Navigation Systems
• Scanning Probe Microscopes
• New Standards of Mass.