Nanoelectronic Coupled Problems Solutions

Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: ter Maten, E. Jan W. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Brachtendorf, Hans-Georg (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Pulch, Roland (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Schoenmaker, Wim (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), De Gersem, Herbert (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
Έκδοση:1st ed. 2019.
Σειρά:The European Consortium for Mathematics in Industry ; 29
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 04707nam a2200541 4500
001 978-3-030-30726-4
003 DE-He213
005 20191106082501.0
007 cr nn 008mamaa
008 191106s2019 gw | s |||| 0|eng d
020 |a 9783030307264  |9 978-3-030-30726-4 
024 7 |a 10.1007/978-3-030-30726-4  |2 doi 
040 |d GrThAP 
050 4 |a TA342-343 
072 7 |a PBWH  |2 bicssc 
072 7 |a MAT003000  |2 bisacsh 
072 7 |a PBWH  |2 thema 
072 7 |a TBJ  |2 thema 
082 0 4 |a 003.3  |2 23 
245 1 0 |a Nanoelectronic Coupled Problems Solutions  |h [electronic resource] /  |c edited by E. Jan W. ter Maten, Hans-Georg Brachtendorf, Roland Pulch, Wim Schoenmaker, Herbert De Gersem. 
250 |a 1st ed. 2019. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2019. 
300 |a XXX, 587 p. 300 illus., 200 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a The European Consortium for Mathematics in Industry ;  |v 29 
505 0 |a Equations, discretizations -- Time integration for coupled problems -- Uncertainty quantification -- Model order reduction -- Robustness, reliability, ageing -- Testcases and measurements. 
520 |a Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability. 
650 0 |a Mathematical models. 
650 0 |a Mathematical optimization. 
650 1 4 |a Mathematical Modeling and Industrial Mathematics.  |0 http://scigraph.springernature.com/things/product-market-codes/M14068 
650 2 4 |a Continuous Optimization.  |0 http://scigraph.springernature.com/things/product-market-codes/M26030 
700 1 |a ter Maten, E. Jan W.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Brachtendorf, Hans-Georg.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Pulch, Roland.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Schoenmaker, Wim.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a De Gersem, Herbert.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783030307257 
776 0 8 |i Printed edition:  |z 9783030307271 
776 0 8 |i Printed edition:  |z 9783030307288 
830 0 |a The European Consortium for Mathematics in Industry ;  |v 29 
856 4 0 |u https://doi.org/10.1007/978-3-030-30726-4  |z Full Text via HEAL-Link 
912 |a ZDB-2-SMA 
950 |a Mathematics and Statistics (Springer-11649)