Reliability Physics and Engineering Time-To-Failure Modeling /

• Κύριος συγγραφέας: McPherson, J. W. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Heidelberg : Springer International Publishing : Imprint: Springer, 2013.
• Έκδοση: 2nd ed. 2013.
• Θέματα: Engineering.; Energy.; Statistics.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Electronics and Microelectronics, Instrumentation.; Quality Control, Reliability, Safety and Risk.; Statistical Theory and Methods.; Energy, general.

Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include:  ·       Materials/Device Degradation ·       Degradation Kinetics ·       Time-To-Failure Modeling ·       Statistical Tool...

Πίνακας περιεχομένων:

• Introduction
• Materials and Device Degradation
• From Material/Device Degradation to Time-To-Failure
• Time-To-Failure Modeling
• Gaussian Statistics – An Overview
• Time-To-Failure Statistics
• Failure Rate Modeling
• Accelerated Degradation
• Acceleration Factor Modeling
• Ramp-To-Failure Testing
• Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB)
• Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering
• Conversion of Dynamical Stresses Into Effective Static Values
• Increasing the Reliability of Device/Product Designs
• Screening
• Heat Generation and Dissipation
• Sampling Plans and Confidence Intervals
• Appendix A: Useful Conversion Factors
• Appendix B: Useful Physical Constants
• Appendix C: Useful Rough Rules-Of-Thumb
• Appendix D: Useful Mathematical Expressions
• Appendix E: Useful Differentials and Definite Integrals
• Appendix F: Free-Energy
• Appendix G: t(1-α/2,ν) Distribution Values
• Appendix H: χ2(P,ν) Distribution Values
• Index.