Liu, X., & Xu, Q. (2014). Trace-Based Post-Silicon Validation for VLSI Circuits. Springer International Publishing : Imprint: Springer.
Chicago Style (17th ed.) CitationLiu, Xiao, and Qiang Xu. Trace-Based Post-Silicon Validation for VLSI Circuits. Heidelberg: Springer International Publishing : Imprint: Springer, 2014.
MLA (8th ed.) CitationLiu, Xiao, and Qiang Xu. Trace-Based Post-Silicon Validation for VLSI Circuits. Springer International Publishing : Imprint: Springer, 2014.
Warning: These citations may not always be 100% accurate.