Trace-Based Post-Silicon Validation for VLSI Circuits

• Main Authors: Liu, Xiao (Author), Xu, Qiang (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Heidelberg : Springer International Publishing : Imprint: Springer, 2014.
• Series: Lecture Notes in Electrical Engineering, 252
• Subjects: Engineering.; Microprocessors.; Semiconductors.; Electronic circuits.; Circuits and Systems.; Processor Architectures.

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and c...

Table of Contents:

• Introduction
• State of the Art on Post-Silicon Validation
• Signal Selection for Visibility Enhancement
• Multiplexed Tracing for Design Error
• Tracing for Electrical Error
• Reusing Test Access Mechanisms
• Interconnection Fabric for Flexible Tracing
• Interconnection Fabric for Systematic Tracing
• Conclusion.