van Schooten, K. (2013). Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Springer International Publishing : Imprint: Springer.
Chicago Style (17th ed.) Citationvan Schooten, Kipp. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Heidelberg: Springer International Publishing : Imprint: Springer, 2013.
MLA (8th ed.) Citationvan Schooten, Kipp. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Springer International Publishing : Imprint: Springer, 2013.
Warning: These citations may not always be 100% accurate.
