van Schooten, K. (2013). Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Springer International Publishing : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)van Schooten, Kipp. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Heidelberg: Springer International Publishing : Imprint: Springer, 2013.
Παραπομπή σε μορφή MLA (8th εκδ.)van Schooten, Kipp. Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Springer International Publishing : Imprint: Springer, 2013.
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