The Boundary-Scan Handbook
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practi...
Κύριος συγγραφέας: | |
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Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Cham :
Springer International Publishing : Imprint: Springer,
2016.
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Έκδοση: | 4th ed. 2016. |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Boundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL)
- Boundary-Scan Testing
- Advanced Boundary-Scan Topics
- Design for Boundary-Scan Test
- Analog Measurement Basics
- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration
- IEEE 1149.8.1: Passive Components
- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision.