Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge res...
Κύριοι συγγραφείς: | Noia, Brandon (Συγγραφέας), Chakrabarty, Krishnendu (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Cham :
Springer International Publishing : Imprint: Springer,
2014.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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