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03225nam a22005895i 4500 |
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978-3-319-04864-2 |
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DE-He213 |
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20151103131659.0 |
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cr nn 008mamaa |
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140508s2014 gw | s |||| 0|eng d |
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|a 9783319048642
|9 978-3-319-04864-2
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|a 10.1007/978-3-319-04864-2
|2 doi
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|a 621.36
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|a Haschke, Michael.
|e author.
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|a Laboratory Micro-X-Ray Fluorescence Spectroscopy
|h [electronic resource] :
|b Instrumentation and Applications /
|c by Michael Haschke.
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|a Cham :
|b Springer International Publishing :
|b Imprint: Springer,
|c 2014.
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| 300 |
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|a XVIII, 356 p. 254 illus., 107 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a text file
|b PDF
|2 rda
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 55
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|a XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.
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| 520 |
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|a Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
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|a Physics.
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|a Spectroscopy.
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| 650 |
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|a Surfaces (Physics).
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| 650 |
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|a Interfaces (Physical sciences).
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| 650 |
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|a Thin films.
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| 650 |
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|a Physical measurements.
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| 650 |
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|a Measurement.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Materials
|x Surfaces.
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4 |
|a Physics.
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2 |
4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Surfaces and Interfaces, Thin Films.
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| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
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| 650 |
2 |
4 |
|a Spectroscopy/Spectrometry.
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| 650 |
2 |
4 |
|a Surface and Interface Science, Thin Films.
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| 710 |
2 |
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|a SpringerLink (Online service)
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|t Springer eBooks
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| 776 |
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8 |
|i Printed edition:
|z 9783319048635
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| 830 |
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 55
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| 856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-3-319-04864-2
|z Full Text via HEAL-Link
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|a ZDB-2-PHA
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| 950 |
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|a Physics and Astronomy (Springer-11651)
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