Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications /

• Κύριος συγγραφέας: Haschke, Michael (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2014.
• Σειρά: Springer Series in Surface Sciences, 55
• Θέματα: Physics.; Spectroscopy.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Physical measurements.; Measurement.; Microscopy.; Materials > Surfaces.; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Measurement Science and Instrumentation.; Spectroscopy/Spectrometry.; Surface and Interface Science, Thin Films.

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of smal...

Πίνακας περιεχομένων:

• XRF-Basics
• Main Components of X-Ray Spectrometers
• Special Requirements for µ-XRF
• Quantification
• Sample Preparation
• Relations to Other Analytical Methods
• Applications.