Ferroelectric Domain Walls Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy /

• Κύριος συγγραφέας: Guyonnet, Jill (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2014.
• Σειρά: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Θέματα: Physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Optical materials.; Electronic materials.; Nanotechnology.; Surface and Interface Science, Thin Films.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Nanoscale Science and Technology.

Using the nanometric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nanoscale interfaces separating regions of differently oriented spontaneous polarization. Due to the local...

Πίνακας περιεχομένων:

• Introduction
• Domain Walls in Ferroelectric Materials
• Experimental Setup
• Lateral Piezoelectric Response Across Ferroelectric Domain Walls
• Electrical Conduction at 180° Ferroelectric Domain Walls
• A Statistical Approach to Domain Wall Roughening and Dynamics: Disordered Elastic Systems
• Measuring the Roughness Exponent of One-Dimensional Interfaces
• Roughness Analysis of 180° Ferroelectric Domain Walls
• Disorder and Environmental Effects on Nanodomain Growth
• Conclusions
• Appendix A Displacement Autocorrelation Function Scaling for Super-Rough Interfaces
• Appendix B AFM for the Eye.