Hot Carrier Degradation in Semiconductor Devices

• Corporate Author: SpringerLink (Online service)
• Other Authors: Grasser, Tibor (Editor)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Subjects: Engineering.; Electronic circuits.; Electronics.; Microelectronics.; Circuits and Systems.; Electronic Circuits and Devices.; Electronics and Microelectronics, Instrumentation.

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energ...