Debug Automation from Pre-Silicon to Post-Silicon

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Dehbashi, Mehdi (Συγγραφέας), Fey, Görschwin (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2015.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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020 |a 9783319093093  |9 978-3-319-09309-3 
024 7 |a 10.1007/978-3-319-09309-3  |2 doi 
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082 0 4 |a 621.3815  |2 23 
100 1 |a Dehbashi, Mehdi.  |e author. 
245 1 0 |a Debug Automation from Pre-Silicon to Post-Silicon  |h [electronic resource] /  |c by Mehdi Dehbashi, Görschwin Fey. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2015. 
300 |a XIV, 171 p. 93 illus., 55 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook. 
520 |a This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs. 
650 0 |a Engineering. 
650 0 |a Microprocessors. 
650 0 |a Electronic circuits. 
650 1 4 |a Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Processor Architectures. 
650 2 4 |a Electronic Circuits and Devices. 
700 1 |a Fey, Görschwin.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783319093086 
856 4 0 |u http://dx.doi.org/10.1007/978-3-319-09309-3  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)