Debug Automation from Pre-Silicon to Post-Silicon

• Main Authors: Dehbashi, Mehdi (Author), Fey, Görschwin (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Subjects: Engineering.; Microprocessors.; Electronic circuits.; Circuits and Systems.; Processor Architectures.; Electronic Circuits and Devices.

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...