Counterfeit Integrated Circuits Detection and Avoidance /

• Κύριοι συγγραφείς: Tehranipoor, Mark (Mohammad) (Συγγραφέας), Guin, Ujjwal (Συγγραφέας), Forte, Domenic (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Θέματα: Engineering.; Microprocessors.; Electronic circuits.; Circuits and Systems.; Processor Architectures.; Electronic Circuits and Devices.

This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade.  The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs)...

Πίνακας περιεχομένων:

• Introduction
• Conterfeit Integrated Circuits
• Counterfeit Defects
• Physical Tests for Counterfeit Detection
• Electrical Tests for Counterfeit Detection
• Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods
• Advanced Detection: Physical Tests
• Advanced Detection: Electrical Tests
• Combating Die and IC Recycling
• Hardware IP Watermarking
• Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly
• Chip ID.