Advanced Transmission Electron Microscopy Applications to Nanomaterials /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Deepak, Francis Leonard (Επιμελητής έκδοσης), Mayoral, Alvaro (Επιμελητής έκδοσης), Arenal, Raul (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Θέματα: Materials science.; Nanochemistry.; Nanoscale science.; Nanoscience.; Nanostructures.; Nanotechnology.; Optical materials.; Electronic materials.; Materials Science.; Optical and Electronic Materials.; Nanotechnology and Microengineering.; Nanoscale Science and Technology.

This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy.  The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applicati...

Πίνακας περιεχομένων:

• Preface
• Introduction to TEM, HRTEM and aberration corrected microscopy
• Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy
• Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles
• Zeolites and Ordered Mesoporous materials under the electron microscope
• Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials
• 3D-nanometric analyses via electron tomography: application to nanomaterials
• In situ TEM of carbon nanotubes
• Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.