Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Carter, C. Barry (Επιμελητής έκδοσης), Williams, David B. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Θέματα: Materials science.; Spectroscopy.; Solid state physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Microscopy.; Continuum mechanics.; Materials Science.; Characterization and Evaluation of Materials.; Nanoscale Science and Technology.; Spectroscopy/Spectrometry.; Solid State Physics.; Spectroscopy and Microscopy.; Continuum Mechanics and Mechanics of Materials.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...