Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Carter, C. Barry (Editor), Williams, David B. (Editor)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Subjects: Materials science.; Spectroscopy.; Solid state physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Microscopy.; Continuum mechanics.; Materials Science.; Characterization and Evaluation of Materials.; Nanoscale Science and Technology.; Spectroscopy/Spectrometry.; Solid State Physics.; Spectroscopy and Microscopy.; Continuum Mechanics and Mechanics of Materials.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...