Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Carter, C. Barry (Επιμελητής έκδοσης), Williams, David B. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Θέματα: Materials science.; Spectroscopy.; Solid state physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Microscopy.; Continuum mechanics.; Materials Science.; Characterization and Evaluation of Materials.; Nanoscale Science and Technology.; Spectroscopy/Spectrometry.; Solid State Physics.; Spectroscopy and Microscopy.; Continuum Mechanics and Mechanics of Materials.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...

Πίνακας περιεχομένων:

• Foreword by Sir John Meurig Thomas
• 1. Electron Sources
• 2. In Situ and Operando
• 3. Electron Diffraction and Phase Identification
• 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns
• 5. Electron crystallography, charge-density mapping and nanodiffraction
• 6. Digital Micrograph
• 7. Electron waves, interference & coherence
• 8. Electron Holography
• 9. Focal-Series Reconstruction
• 10. Direct Methods For Image Interpretation
• 11. Imaging in the STEM
• 12. Electron Tomography
• 13. Energy-Filtered Transmission Electron Microscopy
• 14. Calculation of Electron Energy-Loss Spectra
• 15. Electron Diffraction & X-Ray Excitation
• 16. X-Ray and Electron Energy-Loss Spectral Imaging
• 17. Practical Aspects and Advanced Applications of XEDS.