Mechanical Properties of Polymers Measured through AFM Force-Distance Curves

• Κύριος συγγραφέας: Cappella, Brunero (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Σειρά: Springer Laboratory, Manuals in Polymer Science,
• Θέματα: Chemistry.; Physical chemistry.; Polymers.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Thin films.; Polymer Sciences.; Nanoscale Science and Technology.; Surfaces and Interfaces, Thin Films.; Physical Chemistry.; Spectroscopy and Microscopy.

This Springer Laboratory volume is a practical guide for scientists and students dealing with the measurement of mechanical properties of polymers at the nanoscale through AFM force-distance curves. In the first part of the book the reader will find a theoretical introduction about atomic force micr...

Πίνακας περιεχομένων:

• Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy
• Force-Distance Curves in Practice
• Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films
• Thin Polymer Films
• Polymer Blends
• Creep Compliance Measurement and Force-Modulation.