Soft Error Mechanisms, Modeling and Mitigation

• Κύριος συγγραφέας: Sayil, Selahattin (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Έκδοση: 1st ed. 2016.
• Θέματα: Engineering.; Microprocessors.; Electronic circuits.; Circuits and Systems.; Electronic Circuits and Devices.; Processor Architectures.

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes...

Πίνακας περιεχομένων:

• Introduction
• Mitigation of Single Event Effects
• Transmission Gate (TG) Based Soft Error Mitigation Methods
• Single Event Soft Error Mechanisms
• Modeling Single Event Crosstalk Noise in Nanometer Technologies
• Modeling of Single Event Coupling Delay and Speedup Effects
• Single Event Upset Hardening of Interconnects
• Soft-Error Aware Power Optimization
• Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.