Samedi, V. G., & Bocklage, T. (2016). Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features. Springer International Publishing : Imprint: Springer.
Chicago Style (17th ed.) CitationSamedi, Von G., and Thèrése Bocklage. Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features. Cham: Springer International Publishing : Imprint: Springer, 2016.
MLA (8th ed.) CitationSamedi, Von G., and Thèrése Bocklage. Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features. Springer International Publishing : Imprint: Springer, 2016.
Warning: These citations may not always be 100% accurate.
