Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

• Κύριος συγγραφέας: Egerton, R.F (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Έκδοση: 2nd ed. 2016.
• Θέματα: Materials science.; Microscopy.; Spectroscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Biological Microscopy.

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a ne...